BASE INTRO

High precision instruments for the determination of nano and micro/macro mechanical properties of thin/thick coatings and substrates. The tool covers from nanometric applications such as measuring hardness and elastic modulus of particles in pharmacology to high loads required to test the fracture toughness of hard coatings in the tooling industry.

Our Mechanical Testers use independent force & depth sensors to obtain depth versus load curves used in instrumented indentation. Force feedback control loop allows stable high precision scratch/adhesion and wear/friction testing.

Both the Platform and Compact Bases can retrofit a ►Nano Module up to 400mN, a
►Micro Module up to 40N and a Macro Module with load up to 200N to cover the widest range in the industry. A ►Non-Contact Profiler and an Atomic Force Microscope are available for high resolution imaging of indents, scratches and wear tracks in addition to allowing other profiling work such as roughness measurements.

BASES

PLATFORM BASE
The Platform Base is equipped with a full video microscope with access to a wide range of microscopy options. Two motorized tables, with 150mm range, and a Z motorized approach of more than 50mm, with a gas-spring slide for a maximum clearance of 140mm gives plenty of space to test larger samples. A clamp comes standard but other sample holders can be made custom. The base also integrates a position contol joypad and an emergency stop botton. The Platform Base has also been built to incorporate, together with the Micro or Macro Module, the Nano Module and the AFM Microscope Objective.

COMPACT BASE
Cost-effective solution with 25mmx100mm XY motorized tables, a
Z motorized approach of 25mm. A video zoom lens is available for scratch analysis or to select the area of test. This model can also fit exchangeable Nano/Micro and Macro Modules. A Compact version without X,Y and Z motorizations is available for only nano-indentation work. On this version, a Z micrometer table allows coarse positioning of the head prior to the measurement and a X micrometer table allows to move at each indent.

ERGONOMIC WORKSTATION
An anti-vibration table is recommended for nanometric level tests. The Ergonomic Workstation integrates a high quality air table in addition to attached flexible arms for both the keyboard and the monitor. A Plexiglas enclosure, independently supported by the table, protects against air movement and sound waves.

PLATFORM (P) /COMPACT (C) OPTIONS & UPGRADE:

• Heating module up to 300 C (max 10N)(not software controlled) (P & C)
• Rotation table for pin-on-disk testing (500rpm) (P & C)
• Long working distance objective lens upgrades (P)
• Video zoom higher magnifications upgrades (C)
• Other objectives (C)
• Air compressor for workstation (P & C)

AFM ATOMIC FORCE MICROSCOPE PROBE SCANNER DS 45-40

• Scan Volume: 40x40x2.7micron
• Infinitely corrected optics, 15X optical
• Adaptor to Nanovea Microscope
• 10 pcs probes/Tip radius below 10 nm.
• Control System DSP based SPM Controller & Board
• SPM Measuring & Analysis Software