If you have troubles viewing please refer to: ►FEB NEWSLETTER                                    

This month Nanovea Inc. is excited to announce its incorporation on January 1, 2009 in the state of California. Nanovea Inc. was created to focus specifically on the development of its instruments and testing services. Pierre Leroux, M. Sc. Eng., managing director of Micro Photonics’s West Coast operation since its opening in 1997, will now serve as Nanovea’s President and CEO.  “We are all very excited about the recent success of Nanovea’s instruments and laboratory services. We look forward to showcasing the team’s dedication to developing superior instruments and lab services under Nanovea’s identity.” ►Contact Nanovea


TRADESHOWS____________________________________________________________________

VISIT US IN APRIL AT ONE OF OUR SHOWS:

►WOM Las Vegas, NV - April 19-23
►ICMC San Diego CA - April 27-May 01

Contact our office for ►Complimentary passes



PRESS RELEASE_________________________________________________________________

FOR IMMEDIATE RELEASE

Nanovea Profilometer Receives “Class 1”Cleanroom Approval

Irvine, CA, January 22, 2009 -- Nanovea Inc. announced today the successful installation of their Optical Profiler within the Class 1 Cleanroom of a leading micro-electronics manufacturer. Class 1 Cleanroom clearance is known for its strict compliance and custom demand for all materials used in the development of the instrument. The advanced 3D non-contact  profiling abilities of Nanovea’s Profilometers will now be an option for the strictest microelectronic cleanroom requirements.

With the use of “clean” motorized linear stages and the proper selection of materials, Nanovea’s engineers custom designed a system that would be compatible with the strict class 1 standards. Class 1 Cleanrooms have a tightly controlled level of contamination and allows for very few particles of any kind. The material selection was crucial in the design of the X-Y stages so that few particles are emitted into the air during testing. The system was also designed with a high degree of flatness, accuracy and with a level of automation that allows the user to measure multiple areas and stitch them together. This will allow the user to create one large, planar surface in order to compare relative flatness with very little user interaction. The measureable area of the custom profiler can be as large as 30cm x 30cm with vertical resolution down to 2nm. A design is also available to scan large, heavy and even immoveable parts.

This is only a glimpse at the projects Nanovea’s engineers have customized. They have also provided a custom built high-speed Profiler with speeds over 30,000 points/second and machine vision with image recognition to improve efficiency. Additionally, Profilers have been built with custom scanning capabilities to acquire surface measurements from both the top and bottom surfaces while measuring the thickness of the material, all with nanometer resolution. “The addition of the cleanroom design will allow Nanovea to work closer with strict environments, and once again shows our dedication to ingenuity.”  Said Craig Leising, Product Manager Nanovea, Inc.
►Learn more about Nanovea Profilometers


APPLICATION NOTES_____________________________________________________________

Nanovea's engineers will now be submitting monthly application notes to give in depth examples of application capabilities.

THIS MONTH: ►Sandpaper Roughness Levels

                                      

PAST MONTHS
►Characterization of One-Dimensional Micro Lens Array
►Adhesion Properties of Compact Disc Coatings

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