NEWS__________________________________________________________________________
PRESS RELEASE
FOR IMMEDIATE RELEASE
Breakthrough Indentation Yield Strength Test by Nanovea

July 14, 2011 – Irvine, CA – Nanovea today introduced its patent pending breakthrough method of reliably acquiring yield strength through indentation; ultimately replacing the traditional tensile testing machine for yield strength measurement.
Traditionally yield strength has been tested by using a tensile testing machine, a large instrument requiring enormous strength to pull apart metal, plastic and others. The yield strength (also known as yield point) of a material in engineering (and or materials science) is the point of stress that a material starts to deform plastically. Before reaching the yield point a material will deform elastically but returns to its original shape when stress is removed. A crucial material property for nano and micro related materials found in advancing industries such as biomedical, microelectronics, energy and many others. Until now the most reliable way took large machine effort, sample preparation, and or was impossible to perform on small samples and localized areas.
By using Nanovea’s Mechanical Tester in indentation mode, using a cylindrical flat tip, yield strength data can be easily obtained. For years now, the indentation test has been used for hardness and elastic modulus measurements. There has traditionally been an issue with linking macro tensile properties to what was measured during an indentation test. Many studies measuring with spherical tips have allowed stress-strain curves but were never able to give reliable tensile yield strength data that corresponded directly to macro tensile data. Nanovea’s patent pending method, using a cylindrical flat tip, gives yield strength directly comparable to what is measured by traditional means. It is believed that the load per surface area at which the cylindrical flat tip penetrates, at increased speed, is directly linked to the load versus surface area at which the material starts flowing in a tensile mode test. Therefore, reliable yield strength results on an endless list of materials, small or large has never before been as obtainable until now.
"This is just another addition, on a long and growing list, of what can be tested with our Mechanical Tester," said Pierre Leroux, Nanovea’s CEO. While this specific test is a breakthrough of great importance, it is ultimately just another reason why the Nanovea Mechanical Tester has the widest testing capability of any mechanical testing system.
For application note visit: Breakthrough Indentation Yield Strength Testing
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All-In-One R&D Photovoltaic Inspection system

By combining a confocal spectral interferometer sensor to the Nanovea 3D Profilometer users now have the expanded capability to measure antireflective coating thickness (mapping down to 200nm). An addition alongside an already supercharged research set-up with the combination of four instruments in one.
The All-in-one system provides users the superior advantages of having the resources of multiple measurement technologies to maximize research advancement. The system includes Nanovea's traditional chromatic confocal optics alongside the addition of a confocal spectral interferometer, atomic force microscope and an optical microscope for visual inspection. The instrument is calibrated for quick and easy movements between each option. For example, the user can begin with an area selected under the microscope, next make a trace height measurement millimeters in length with the chromatic confocal sensor(among many other surface measurements), then move under the atomic force microscope to investigate surface at sub-nanometer range. And if thickness is of concern, the confocal spectral interferometer can quickly be chosen for thickness measurement.
The system has been developed from an increased interest in the solar community, and many others, in need of an inspection system with broad research capability. Each option can be used solely or in combination for an enhancing result in time savings and increased research productivity.
Learn more about Nanovea Profilometers
APPLICATION NOTE_____________________________________________________________
THIS MONTH:
►Breakthrough Indentation Yield Strength Testing
►Wood Surface Measurement Using 3D Metrology
PREVIOUS MONTHS:
►Fractography Analysis Using 3D Metrology
►Nanoindentation Fracture Toughness
►Plastic Film Texture Measurement With 3D Metrology
►Nanoindentation Creep Measurement
►O-ring Surface Inspection With 3D Metrology
►Cyclical Nanoindentation Stress-Strain Measurement
►Microindentation & Fracture of Mineral Rock
►Paper Roughness Measurement With 3D Metrology
►Using Nano Scratch Testing For Composite Failure
For more of Nanovea's ►application notes
LABORATORY__________________________________________________________________
HERE IS EXAMPLES OF WHAT WE TESTED THIS MONTH:
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Mechanical:
• Nanoindentation oscillation of thin films
• Nanoindentation of peened surface
• Nano yield strength of mems
• Nano scratch of stent
• Nano scratch of microstrip
• Nano wear of implant
• Micro scratch of aluminum parts
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3D Non-Contact Metrology:
• Profile of micromachined surface
• Profile of anodization surface
• Planarity of micro marks
• Roughness of peened surface
• Topography of wood surface
• Step height of micro channel
• Step height of printed electronics
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Tribology:
• COF of silicon
• COF of polytetrafluoroethylene
• 36hr wear rate of dlc
• Wear rate of glass
• High temp wear rate of graphite
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TRADESHOWS__________________________________________________________________
MS&T 2011: October 16-20, 2011 | Columbus, Ohio
The MS&T partnership of four leading materials societies (ACerS, AIST, ASM & TMS) brings together scientists, engineers, students, policy makers, suppliers & more to discuss current research and technical applications & to shape the future of materials science and technology. Since corrosion remains a relevant topic to materials, NACE will again co-sponsor MS&T. Whether just starting a career in materials science or seasoned professional, MS&T offers an unmatched opportunity to network and learn. ►contact Nanovea for guest passes
Today's standard for tomorrow's materials.© 2011 NANOVEA
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