Aspheric Lens Topography With 3D Non-Contact Metrology

If you have troubles viewing please refer to: ►MAY NEWSLETTER

NEWSLETTER MAY 2009

COMPANY______________________________________________________________________

Nanovea would like to thank new and existing clients who visited the booth at WOM in Las Vegas or ICMC in San Diego. We look forward to seeing those who can make it for SPIE (Optifab)
May 12-14 in Rochester, NY. Thank you for supporting our newsletter and please let us
know how we can improve. info@nanovea.com

NEWS__________________________________________________________________________

DEVELOPING NEWS

Nanovea is excited to announce its collaboration with the Graphic Studio at the
Institute for Research in Art University of South Florida. The Graphic Studio, and an undisclosed artist, will be recreating a vinyl record surface in sculpture form by the precise 3D measurements of Nanovea's ST400 Optical Profiler. Nanovea will release more on this exciting collaboration as the information becomes available.

                 3D Vinyl Record Surface                          Vinyl Record Sculpture

Also this month, the New Nanovea Tribometer is under development! The Tribometer will have a complete facelift with a sleek black design to complete Nanovea's signature look of instruments. The New Tribometer will also shed much of its unneeded size making for a more compact design. Several New Testing features will also be included in the design, stay tuned for official release.

LABORATORY___________________________________________________________________

Examples of what we tested this month:

Scratch:
• Adhesion of ceramic coatings to metal substrate
• Adhesion of drug/polymer coating on metal stents
3D Metrology:
• Roughness of tablets
• Roughness / flatness of thick glass
• Flatness / angle of inclination of die glued to surface
• Topography of etched silicon die array
• Topography of wear / corrosion
• Topography of grooves on a music a record

APPLICATION NOTES____________________________________________________________

Nanovea's engineers will now be submitting monthly application notes to give in depth examples of application capabilities.

THIS MONTH:

►Aspheric Lens Topography With 3D Non-Contact Metrology

                                          3D Aspheric Lens

►Wear Resistance Analysis With Tribometer Friction Measurements



PAST MONTHS:

►Quality Control Comparison of Tablet Roughness
►Wear Rate Analysis Using Tribology & 3D Metrology
►Scratch Resistance of Bulk Materials
►Topography & Roughness Study of Various Sandpaper Grits
►Characterization of One-Dimensional Micro Lens Array
►Adhesion Properties of Compact Disc Coatings

TRADESHOWS__________________________________________________________________

THIS MONTH:

►SPIE (OPTIFAB) Rochester, NY - May 12-14

3D Aspheric Lens

Visit us at SPIE (OPTIFAB) for a live demonstration during the exhibit hours. Take advantage of this opportunity to have your sample analyzed with 3D Non-Contact Metrology. There is no appointment necessary but to ensure that a measurement time is available you can send a request with an approximate time to Craig Liesing: craig@nanovea.com

FOLLOWING MONTHS:

►MS&T Pittsburgh, PA - October 25-29

►MRS Boston, MA - November 30-December 4

Contact our office for ►complimentary passes to any of our shows