PROFILOMETERS INTRO
Nanovea 3D Non-Contact Profilometers are designed with leading edge optical pens using superior white light axial chromatism. Nano through macro range is obtained during measurement (Profile Dimension, Roughness Finish Texture, Shape Form Topography, Flatness Warpage Planarity, Volume Area, Step-Height Depth Thickness and others) on a wider range of geometries and materials than any other Profilometer. With the use of a large range of optical pens the Profilometer precisely measures an endless range of applications. Nanovea optical pens have zero influence from sample reflectivity, variations require no sample preparation and have advanced ability to measure high surface angles. Easily measure any material: transparent, opaque, specular, diffusive, polished, rough etc. Unlike other optical measurement techniques, large surface areas can be precisely measured without any imaging stitching. For applications exceeding Profilometer capability an AFM integration is available to maximize measurement range. All Profilometers use the same Software and Nanovea PRVision is optional on most Profilometers for auto pattern recognition. Profilometer speeds range from 7mm/s to 1m/s for laboratory or research to the needs of hi-speed inspection on large surface areas. Nanovea Profilometers can be built with custom size, speeds, scanning capabilities, Class 1 Clean Room compliance, with Indexing Conveyor and for Inline or online Integration and now with true portability capability. *For Profilometer specifications see brochure download. For Profilometer technical testing data see application notes. For Profilometer videos visit Nanovea YouTube.
PROFILOMETERS
Jr25 Optical Profilometer | True Portable Capability
Using the same technology and software as the PS50, along with 25mm X-Y stages, the high-performance, portable Jr25 Profilometer provides measurement capability rarely available for immovable objects or during field study. The Jr25 has a small footprint (27cm x 14cm) with a total weight less than 5.5 Kg and runs on a laptop, which makes for portable ease. With a fully rotational, single axis, head the Jr25 has the ability to measure surfaces at difficult angles. Durable carrying case for safe and secure transport. Ideal option for portable measurement needs during field studies or immovable objects in processing environments.
• Weight less than 5.5kg • Footprint 27cm x 14cm • 25mm x 25mm XY • True portable non contact 3D measurement capabilities
PS50 Optical Profilometer | Limited Budget
Using the same technology and software as the ST400, along with 50mm X-Y stages, the high-performance PS50 Profilometer is the ideal choice to replace stylus and laser profilers. The PS50 has a small footprint (30cm x 25cm) and the option of running on a laptop, which makes for an easy installation where space is critical. Ideal option for budget limitations and small research facilities.
• Compact size • 50mm x 50mm XY • Upgrade Replacement From Stylus and Laser Profilers • Budget Friendly Leading Technology
ST400 Optical Profilometer | Nanovea Standard
150mm X-Y stages and a large coarse height adjustment to easily accommodate larger sample sizes and large scan areas. The ST400 Profilometer also has an optional offset camera, with either manual or motorized zooms, to easily identify small features prior to measuring them. The Custom ST400, a more open configuration, allows for the addition of larger X-Y stages to measure even larger areas, a 360° rotational stage for measuring spherical or cylindrical parts and many other custom configurations. Available with various automation options. Ideal option for diverse and expanding measurement needs.
• 150mm x 150mm XY • Various Options • Spacious Platform Area for Unique Sample Size • (PRVision) Image Pattern Recognition
HS1000 Optical Profilometer | Hi-Speed Automated Inspection
For more on Nanovea's stand alone and inline automated optical inspection systems.
SURFACE MEASUREMENT
(Nano | Micro | Macro Range)
Roughness Texture Finish • Profile Dimensional • Topography Shape Form • Flatness Warpage Planarity • Volume Area • Step-Height Depth Thickness and others
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