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PROFILOMETERS INTRO

Profilometers VideoNanovea 3D Non-Contact Profilometers are designed with leading edge Optical Pens using superior white light axial chromatism to obtain nanometer resolution during hi-speed surface inspection, 3D metrology and more precise thickness mapping on a wider range of geometries and materials than any other Profilometer. With the use of a large range of Optical Pens the Profilometer precisely measures an endless range of applications. All Profilometers use the same Software and Nanovea PRVision is optional on most Profilometers for auto pattern recognition. Profilometer speeds range from 20mm/s to 1m/s for laboratory or research to the needs of hi-speed inspection. Nanovea Profilometers can be built with custom size, speeds, scanning capabilities, Class 1 Clean Room compliance, with Indexing Conveyor and for Inline or online Integration.*For Profilometer specifications see brochure download. For Profilometer technical testing data see application notes.


PROFILOMETERS

PS50 Optical ProfilerPS50 Optical Profiler | Limited Budget
The PS50 Optical Profilometer was designed with table space and overall price in mind. Using the same technology and software as the ST400, along with 50mm X-Y stages, the high-performance PS50 is the ideal choice to replace stylus and laser profilers. The PS50 has a small footprint (30cm x 25cm) and can be run from a laptop making for an easy installation where space is critical. Ideal option for budget limitations and small research facilities.

 
                                Low Price Compact Size Broad Application Use 50mm x 50mm XY scan area Replace Your Stylus


ST400 Optical ProfilerST400 Optical Profiler | Nanovea Standard
The ST400 Optical Profilometer is designed with 150mm X-Y stages and a large coarse height adjustment to easily accommodate larger sample sizes. The ST400 also has an optional offset camera, with either manual or motorized zooms, to easily identify small features prior to measuring. The open configuration of the ST400 allows for custom X-Y stage sizing to measure larger areas and samples, a 360° rotational stage for measuring spherical or cylindrical parts and many other custom configurations. Available with various automation capabilities. Ideal option for diverse and expanding measurement needs.

                                 150mm x 150mm XY scan area Offset Video Camera Automated Recipes 360° Rotational Stage
                                (PRVision) Image Pattern Recognition


CR750 Optical ProfilerCR750 Optical Profiler | Strict Environment
The CS750 Optical Profilometer was built and approved for Class 1 Clean room use, an approval process known for its strict compliance in all materials used in instrument development. Prior to the CR750, advanced 3D Non-Contact profiling technology was rarely available for class 1 compliance. The CS750 was also designed with a high degree of flatness and accuracy by using precision machining and high quality components. The CR750 has an X-Y stage measurement area of 15cm x 20cm and is built on a granite base to enhance stage flatness. Ideal option for strict environments in need of compatible measurement solutions.

                                Class1 Clean Room Compatible Rare Technology For Strict Environments Enhanced Granite Base
                                (PRVision) Image Pattern Recognition

HS1000 Optical ProfilerHS1000 Optical Profiler | Hi-Speed Automated Inspection
The HS1000 Optical Profilometer allows hi-speed inspection 50 times faster than most inspection systems in its class. Inspection speeds can reach up to 1m/s and data acquisition up to 31KHz providing crucial inspection for more time constraint production and quality control environments. The HS1000 is made mostly of granite to provide superior stability and comes with an optional enclosure workstation to create a fully contained stand-alone instrument. The HS1000 can also be equipped with an 180point line sensor to make inspection up to 180 times faster, which gives 1m/s stage speed and an acquisition rate up to 324,000. Ideal option for hi-speed automation and quality control environments. An optimized version of the HS1000 Profilometer for Photovoltaic inspection is available. The HS100/PV is capable of acquiring up to 31,000 points per second and scan areas up to 1m x 1m.  Applications can range from wafer roughness, flatness, trace height to glass roughness and flatness. The HS1000/PV will be available stand alone or inline for integration into panel or wafer production lines for quality control inspection.

                               Hi-Speed Automated User Friendly Technology (PRVision) Image Pattern Recognition
                               Enhanced Granite Structure Safety Enclosure Workstation Indexing Conveyor or Inline Integration Option
                                31,000 points per second and scan areas up to 1m x 1m for inline quality control

 
 
   

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