Introduction to the Nanovea Nano-Indentation Tester
The Nanovea Nano-Indentation Tester with IBIS technology is a high precision instrument for the determination of the nano mechanical properties of thin films, coatings and substrates. Micro Photonics collaborated with renown nano-mechanical expert Dr. A.C. Fischer-Cripps to offer this advanced technology. With the Nanovea Nano-Indentation Tester you can quickly determine properties such as hardness and Young's modulus on almost any type of material - soft, hard, brittle or ductile. 

The Nanovea Nano-Indentation Tester works on the following principle. An indenter tip (Berkovich, Sphero-conical, Knoop or cube corner), normal to the sample surface, with a known geometry is driven into the sample by applying an increasing load up to some preset value. The load is then gradually decreased until partial or complete relaxation of the sample has occurred. The load and displacement are recorded continuously throughout this process to produce a load displacement curve from which the nano-mechanical properties such as hardness, Young's modulus, stress-strain studies, time dependant creep measurement, fracture toughness, plastic & elastic energy of the sample material can be calculated. The Nanovea Nano Indentation Tester can be used in a mapping mode to take data automatically from a variety of locations on your sample. 

Nano-Indentation Module with IBIS Technology
The Nano-Indentation Module is designed with high quality workmanship for longevity and accurate, repeatable results. Unique features include a closed loop force feedback system separates out the force actuation from the force sensor, an essential component for precise control of the indentation process.

Multiple-Frequency Indentation Testing
 Only the Nanovea Nano-Indentation Tester offers multiple-frequency indentation testing to 500 mN. This breakthrough technique for stroboscopic nano-indentation studies, is essential for those researching deformation as a result of frequency influences on visco-elastic substrates such as plastics polymers, and MEMS. Unlike conventional dynamic indentation methods, multiple-indentation testing utilizes a superposition of frequencies. Fourier analysis separates the frequency dependent storage and loss moduli and complex viscosity of the specimen. A single frequency estimation with dynamic indentation methods, only provides one data point in a spectrum of material response. Multiple frequency nano-indentation testing allows the user to see the full visco-elastic material response.

AFM Objective
An optional Atomic Force Microscope (AFM) objective can be fitted in addition to the standard optical microscope. As well as providing the most accurate determination of the contact area, high resolution AFM imaging close to, or within the indentation can provide valuable information about the mode of deformation in the material. The addition of a scanning probe microscope allows access to a whole new range of capabilities with the Nanovea Nano Indentation and Nanovea Scratch Testers, allowing the user to view features of the indentation such as pile-up, cracking, delamination, slip bands and other characteristics of failure in great detail. Unlike other AFM objectives, the Dualscope AFM avoids actual contact with the sample surface yet presents a very accurate image (to the <1nm) of the surface topology.

IBIS Instrumented Indentation Analysis Software
The IBIS indentation software offers the traditional Oliver & Pharr method of analysis with a powerful non-linear solver for fitting the unloading curve (effective indenter shape). Both quasi-static and multiple-frequency dynamic test data can be analyzed.