Nanovea DS700 Dual Scanner

Double Sided Non-Contact Profiling & Simultaneous Thickness Measurement

"Industry Leader in its class"

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Features of Nanovea DS700 Dual Scanner
  • Simultaneous double-side profilometry with total thickness measurement
  • Ideal for paper, textile, metal foils, thin plastic, or other thin pate materials.
  • Fast non-contact technique
  • No sample preparation
  • High Z resolution down to 2nm
  • Z range up to 48mm
  • Rough or polished surfaces

Laboratory services available. Call 1-866-333-4674 for more information.

Click here for Nanovea ST400, Nanovea PS50

See our full range of profilometers and roughness testers

Introduction to the Nanovea DS700 Dual Scanner
Nanovea DS700 Dual Scanner is equipped with two optical pens using white light & the unique chromatic aberration technique. The two pens have the ability to acquire surface measurements from both the top and bottom surfaces while measuring the thickness of the material, all with nanometer resolution. The chromatic aberration technique has the advantages of working on high angular slopes (up to 80degree for specular surfaces), and on samples with low reflectivity. Therefore the Nanovea Dual Scanner works for a wider variety of applications compared to white light interferometry techniques. The system is equipped with two powerful complementary software. A user-friendly software allows easy setup of parameters such as the scan size, the number of lines, the step size, the translation stages speed, the data acquisition rate, the selected probe. Applications of white light axial chromatism technique

The 3D MOUNTAINS MAP data post-processing software allows a lot of surface and profile analysis and studies like : Abbott-Firestone curve, FFT, auto correlation function, 3D representation, slices and much more.

 
Specifications of Nanovea DS700 Dual Scanner
X & Y Motorized Table Range 100mm (other sizes available upon request)
Z Axis Range 100mm (manual micrometer to come inside the working distance)
Maximum Data collection rate up to 4000 points/second 
Maximum X,Y Axis speed 20 mm/sec
  Optical Measuring Pen- Description

 

Optical Measuring Pen - Specifications

Choice of several interchangeable displacement probes to fit Nanovea Profilers.
Measurement Range
Working Distance (mm)
Axial Resolution (nm)
Axial Accuracy (nm)
Spot Diameter (µm)
Lateral Resolution (µm)

Slope (°)

up to 80° for specular surfaces

Min Measurable Thickness (µm)
20µm
0.37
2
10
3

1.5
48
12
130µm
3.3
5
20
2
1.1
43
7
300µm
5.68
10
90
7.4
3.7
25
25
350µm
12.7
10
60
7
3.5
27
25
400µm
11
12
60
2.6
1.3
28
15
1mm
23.9
30
300
14 6
6
24
23
1.2mm
12.7
25
200
4
2
27
25
3mm
26.9
100
600
25
12.5
12
220
3.5mm
16.4
75
400
8
4
22
60
10mm
66.9
300
900
51
25.5
12
425
12mm
29
280
900
16
8
14
200
24mm
222.3
1500
3000
100
50
5
1570
27mm
19.6
600
3000
16
8
8.6
590

2µm - 100µm (Interferometric)
42
10
100
20
10
7
2

 

 
Contact Information or e-mail us to request information
Click Here to access our on-line request form 
June 11, 2008
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