PS50 / 2D & 3D Non-Contact Profiling
MicroTopography / Surface Roughness / Dimensional Metrology
Film Thickness Measurements / Form and Texture Surface Analysis
Precision Machining Quality Control / Industrial Surface Testing

Features of Nanovea PS50

  • Best choice to replace contact profilers
  • Fast non-contact technique
  • Affordably priced
  • Compact and easily portable apparatus
  • No sample preparation
  • Interchangeable optical measuring pens
  • Accepts a wide range of materials
  • 2D & 3D profiles
  • Rough or polished surfaces

Laboratory services available. Call 1-866-333-4674 for more information.

Click here for Nanovea ST400, Nanovea DS700

See our full range of profilometers and roughness testers

Browse through more than 80 applications!

Introduction to the Nanovea PS50 Non-Contact Profiler
Nanovea PS50 Non-Contact Profiler is a compact, portable system that allows users to easily interchange pens to suit the application. Using white light & the unique chromatic aberration technique, which has been shown to be much better than laser techniques in measuring roughness, this profiling system can provide some of the same benefits of our more expensive systems, but at a much lower price tag.

Motorized table allows scans up to 50mm in size, and comes equipped with your choice of powerful user-friendly Professional Mountains Map 2D or 3D software.

All systems are equipped with two powerful complementary software. A user-friendly software allows easy setup of parameters such as the scan size, the number of lines, the step size, the translation stage speed, the dta acquisition rate and the selected probe.

The Ultra, Expert and Profesional version of 3D Mountains Map data post-processing software allows a lot of surface and profile analysis and studies like: Abbott-Firestone curve, FFT, auto correlation function, 3D representation, slices and much more.

 

Specifications of Nanovea PS50
X & Y Motorized Table Range 50mm
Z Axis Range 40mm (manual micrometer to come inside the working distancel)
Maximum Data Collection Rate Up to 30,000 points/second 
Maximum X,Y Axis speed 10 mm/sec

 

   Optical Measuring Pen- Description

 

Optical Measuring Pen - Specifications

Choice of several interchangeable displacement probes to fit Nanovea Profilers.
Measurement Range
Working Distance (mm)
Axial Resolution (nm)
Axial Accuracy (nm)
Spot Diameter (µm)
Lateral Resolution (µm)

Slope (°)

up to 80° for specular surfaces

Min Measurable Thickness (µm)
20µm
0.37
2
10
3

1.5
48
12
130µm
3.3
5
20
2
1.1
43
7
300µm
5.68
10
90
7.4
3.7
25
25
350µm
12.7
10
60
7
3.5
27
25
400µm
11
12
60
2.6
1.3
28
15
1mm
23.9
30
300
14 6
6
24
23
1.2mm
12.7
25
200
4
2
27
25
3mm
26.9
100
600
25
12.5
12
220
3.5mm
16.4
75
400
8
4
22
60
10mm
66.9
300
900
51
25.5
12
425
12mm
29
280
900
16
8
14
200
24mm
222.3
1500
3000
100
50
5
1570
27mm
19.6
600
3000
16
8
8.6
590

2µm - 100µm (Interferometric)
42
10
100
20
10
7
2
Contact Information or e-mail us to request information
Click Here to access our on-line request form 
August 25, 2008
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